Feeding the demand for faster and more reliable data connections, modern communications networks increasingly rely on high-performance fiber optics and photonics components. Luna’s advanced photonic test solutions help engineers bring new photonic technology to market faster and more efficiently.
Developers and manufacturers of fiber optic systems and photonic components rely on Luna to deliver the data needed to analyze and optimized designs and quickly characterize and diagnose the optical performance of fiber optic assemblies, connectors, component and photonic integrated circuits (PICs).
Luna’s systems can deliver very fast and accurate results for end-of-line manufacturing test, or deployed as an advanced analyzer, delivering new insight to help develop and optimize today’s advanced photonic devices and systems.
Explore Key Solutions below for examples of Luna systems delivering essential capabilities for photonic devices, components and fiber optics.
Optical Device Test and Characterization
Optical device test and characterization, based on optical frequency-domain reflectometry (OFDR), delivers the fastest and most complete characterization of fiber optic components, including PICs and silicon photonics. Fully characterize an optical component in a single three-second scan with full polarization analysis and incredible spatial resolution.
Testing Fiber Optic Networks and Assemblies
Luna’s fiber optic test solutions provide unprecedented visibility with fast and accurate characterization of waveguide devices, integrated optical devices, fiber components, cables and short networks. Ultra-high resolution reflectometers spatially map loss, including IL and RL measurements, along a network, allowing precise location of loss events, bad connectors, fiber bends and more. Also, Luna offers the industry’s highest-resolution portable reflectometer designed for field maintenance applications.
Optical Component Test
Distributed Component Analyzers
Fiber Optic Network Test
Distributed Network Analyzers (Reflectometers)
Polarization Management and Emulation
From Our Blog
Upgrade Your Fiber Optic Diagnostics with Portable Ultra-High Resolution Optical Backscatter Reflectometry
This webinar will explain how portable OBR technology can locate and analyze issues and defects in fiber optic assemblies with submillimeter technology, and make very precise measurements of fiber optic latency and length
Accelerate Silicon Photonics Development with Advanced Testing and Automation
This webinar describes Luna's advanced approach to silicon photonics testing and Maple Leaf Photonics' modular and flexible platform for automated testing of dies, and how these two technologies integrate into an effective complete solution for silicon photonics.
Polarization in Fiber Optic Systems: How to Measure and Manage for Optimal Performance
This webinar explains the fundamentals of polarization properties and parameters and describes the different techniques used to measure and control polarization-related impairments.