OVA 5100 Optical Vector Analyzer by Luna
OVA 5100

Optical Vector Analyzer

The Luna OVA 5100 is the fastest, most accurate and economical tool for loss, dispersion and polarization measurements of modern optical networking equipment.

*The OVA 5100 is a direct replacement for the OVA 5000 with equivalent functionality. For more information on the differences, see this comparison of OVA 5100 and OVA 5000.

Product Description

The OVA 5100 is the ideal device for single-connection, all-parameter characterization of fiber components from couplers to specialty fiber and everything in between (Fiber Bragg Gratings, arrayed waveguide gratings, free-space filters, tunable devices, amplifiers, etc.), all with a single sweep of a tunable laser.

The OVA 5100 uses an interferometric method to directly measure the linear transfer function (Jones Matrix), from which all standard linear parameter measurements can be accurately extracted.

  • Key Features
    • Single measurement, all-parameter analysis
    • Full characterization of components in less than 3 seconds
    • Complete polarization response
    • With single scan, simultaneously measure loss, polarization, dispersion, phase and time domain response
    • Available for C and L band, or O band
  • Specifications
    Wavelength range

    1525 - 1610 nm (OVA 5000)

    1270 - 1340 nm (OVA 5013)

    Wavelength resolution 1.6 pm
    Dynamic range 80 dB
    • Insertion Loss (IL)
    • Polarization Dependent Loss (PDL)
    • Polarization Mode Dispersion (PMD) and
    • Second-Order PMD
    • Chromatic Dispersion (CD)
    • Group Delay (GD)
    • Optical Time Domain Response
    • Jones Matrix Elements
    • Optical Phase Response
    Device length Up to 150 m/75 m (transmission/reflection)

    For full specifications, please download the data sheet.

  • Documentation

Solutions and Applications

Silicon photonics testing with the OVA 5100 by Luna

The OVA 5100 is the most comprehensive passive optical component analyzer available for research, product development and manufacturing test.

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