Optical Device Testing and Characterization

PIC and Silicon Photonics Testing

Photonic integrated circuits (PICs) are a key enabler driving advances in communications, optical computing, aerospace, defense and medical applications. Photonics integrated circuitHowever, PICs introduce unique measurement challenges, and testing remains a large contribution to the overall cost of bringing products to market. Effective testing of modern PICs requires more comprehensive and sophisticated methodologies to ensure optimal performance and reduced development costs. 

Luna’s wide range of test and measurement solutions provide customers with high accuracy, resolution and measurement speed instruments to quantitatively assess the optical performance of each component on the chip, whether early in the prototyping stage or in production.

access chips from one side or both

Luna has the technology to look inside PICs in the transmission mode or reflection mode with micrometer-level spatial resolution for a complete optical characterization of the device.

Typical measurements include:

  • Insertion loss (IL)
  • Return loss (RL)
  • Polarization-dependent loss (PDL) vs. wavelength
  • Reflectivity/transmission loss vs. distance
  • Reflectivity/transmission loss vs. wavelength
  • Phase response
  • Group delay (GD)
  • Chromatic dispersion (CD) vs. wavelength
  • Polarization mode dispersion (PMD) vs. wavelength
  • Second-order PMD vs. wavelength
  • Min/Max Loss due to Polarization
  • Impulse response
  • Jones matrix and Mueller matrix elements
  • Phase Ripple – Linear and Quadratic
  • Polarization Performance vs. Distance
  • Polarization Crosstalk vs. Distance
  • Degree of Polarization (DOP), State of Polarization (SOP) and  Polarization Extinction Ratio (PER)

Featured Products

Optical test products

Optical Component Test

Fiber optic network test products

Fiber Optic Network Test


Polarization Management and Emulation

Fiber optic network test products

Fiber Optic Network Test

Test and characterize fiber optic cables, assemblies and network with unmatched speed, precision and spatial resolution. Luna’s OBR reflectometers can analyze loss with a spatial resolution and sensitivity unmatched in the industry.

Polarization Management and Emulation

Control and manage polarization in your optical system with our lossless fiber-squeezer based multifunctional polarization controllers for highest performance. Emulate all polarization impairment parameters including SOP, PMD, and PDL, with our complete line of emulation products for network and system characterization.