OCDR-1000 Product
OCDR-1000

Optical Coherence Domain Reflectometer

The OCDR-1000 is an optical coherence domain reflectometer designed to obtain space- resolved reflection information inside a fiber optical component, such as a Photonic Integrated Circuit (PIC) for diagnosing quality or design issues.

Product Description

The OCDR-1000 is based on a polarization optimized white light interferometer. It is a low cost alternative to OFDR technology. The high dynamic range avoids the masking of small reflection peaks by the large reflections typical of the input surface of an optical device. A set of length matching delay modules is available to match the pigtail lengths of the devices to be measured and place the 600mm measurement span in the region of interest. With a reflection dynamic range of over 70 dB and a spatial resolution down to 15 μm, this instrument helps engineers and researchers see the inside of an optical device to precisely identify defects and their locations.

  • Key Features
    • Distributed reflectivity measurement
    • Event detectionLarge RL range
    • High spatial resolution
    • Clear identification of large and small peaks enables easier data interpretation
  • Specifications
    Wavelength 1310 or 1550 nm
    Spatial resolution <20µm in SMF-28 fiber
    Spatial accuracy <0.1 (±0.01%) mm in air
    Measurement range 600mm
    RL dynamic range 70 dB
    RL total measurement range 10 to 88 dB
    RL sensitivity −90 dB (−95 dB typical)
    RL accuracy ±1.0 dB

    For full specifications, please download the data sheet.

  • Documentation

Solutions and Applications

Silicon photonics testing

The OCDR-1000 provides clear, easily interpretable reflectivity and path length measurement for small devices and assemblies under 600mm.

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