Resource Library

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We have developed this library of resources to provide access to the tremendous amount of content that we have developed over the years. It includes product-specific literature, application-based technical resources, and media presentations of our unique technologies.

If you know which specific product or application you’re looking for, simply click on that link below and you’ll find in-depth content. Alternatively, you can use the search function to connect you to literature and media related to your specific interest.

Application Notes

Title
Product Area
Polarization Related Tests for Coherent Detection Systems
  • Polarization
  • Optical Test
Link
Polarization-Related-Tests-for-Coherent-Detection.pdf
Silicon Photonics and PIC Testing - Overview
  • Optical Test
  • Polarization
Short Summary
Summary of OFDR-based measurement systems for fast and accurate test and characterization of silicon photonics and PICs (photonic integrated devices).
Link
Silicon Photonics and PIC Testing
Skew and Strain Measurements Using the Optical Backscatter Reflectometer to Support TIA FOTP 455038
  • Optical Test
Short Summary
Step-by-step procedure to guide user in determining skew and strain using the OBR system.
Link
LT_TD-EN-FY1315_Skew-and-Strain-measurements-using-OBR-v5.pdf
Techniques for Measuring the PDL of Optical Systems or Components _ https://lunainc.com/wp-content/uploads/2020/05/PDL-Measurement-Note-6-5-2020.pdf
  • Polarization
  • Optical Test
Link
PDL-Measurement-Note-6-5-2020.pdf
Using the Optical Vector Analyzer for Component Evaluation in a Production Environment
  • Optical Test
Short Summary
Steps for setting up the OVA for production line component characterization
Link
LT_TD_EN-FY1309_OVA_Component_Evaluation_v3.pdf
Using the OVA’s Compression Option to Narrow Impulse Responses Broadened by Dispersion
  • Optical Test
Short Summary
An explanation of the OVA’s pulse compression feature and its use, including an overview of dispersion. Use of the pulse compression feature is demonstrated for two devices with highly different levels of dispersion.
Link
PulseCompression_OVA_EN-FY1501.pdf
Why Coherent Detection Systems May Fail at Compensating for Polarization Mode Dispersion
  • Polarization
  • Optical Test
Link
White-Paper-Coherent-Detection-Systems-PMD-Compensation.pdf

Videos

Title
Product Area
Introduction to OVA 5000 Component Analyzer
  • Optical Test
Short Summary
Overview and capabilities of the OVA 5000 system
Link
http://www.youtube.com/watch?v=gLceHGGEvvg
Luna Phoenix 1400 Laser Video
  • Optical Test
Short Summary
Phoenix capabilities
Link
http://www.youtube.com/watch?v=XW_3HkWLNnE

Tech Notes

Title
Product Area
Calculating chromatic dispersion (CD) for fiber measurements using the OVA
  • Optical Test
Short Summary
Equations for calculating CD with OVA
Link
LT_TD_EN-FY1308_CD-Fiber-Measurements_v3.pdf
Calculating Group Delay and Chromatic Dispersion from OVA Optical Phase
  • Optical Test
Short Summary
The OVA calculations for GD and CD are presented, along with a straightforward way for the user to calculate these parameters, starting from the OVA optical phase measurement, with a user-defined optical frequency derivative step size.
Link
LT_TD_EN-FY1305_OVA-GD-and-CD-from-Phase_Rev-2.pdf
Choosing a Mode Conditioner for Use with the Optical Backscatter Reflectometer in Diagnosing Multi-Mode Fiber
  • Optical Test
Short Summary
This application note discusses three methods of mode conditioning with MMF, the advantages and disadvantages of each method, as well as when to use them with an OBR.
Link
LT-TD_EN-FY1303_OBRwModeConditioner_Rev-2.pdf
Computing Insertion Loss when Transitioning Through Dissimilar Fiber
  • Optical Test
Short Summary
Discusses steps for calculating insertion loss (IL) when measuring through dissimilar fiber with shifts in the Rayleigh scatter levels.
Link
LT_TD_EN-FY1302_Computing-Insertion-Loss_Rev-2.pdf
Optical Backscatter Reflectometer Length Measurement Accuracy
  • Optical Test
Short Summary
Technical note detailing how Luna's Optical Backscatter Reflectometers (OBR) is capable of measuring fiber lengths with very high accuracy. Assuming the group index of refraction is well known, length measurement accuracy for the OBR 4600 and 5T-50 is expected to be better than 0.0034% immediately after calibration.
Link
LT_TD_ENFY14-06_OBR_LengthMsrmt_Rev1.pdf
OVA 5100 versus OVA 5000
  • Optical Test
Link
OVA 5100 versus OVA 5000
Phase Ripple Measurements with the Optical Vector Analyzer
  • Optical Test
Short Summary
Luna ’s Optical Vector Analyzer has the ability to make phase error measurements. Both “Phase Ripple Linear” and “Phase Ripple Quadratic” are now available from the drop down graph option in the OVA software.
Link
LT_TD_EN-FY1307_OVA-Phase-Ripple-updated.pdf
Test Summary: Spool Skew and Strain Measurements Using the Optical Backscatter Reflectometer
  • Optical Test
Short Summary
Test results measuring skew and strainusing an OBR.
Link
LT_TD_EN-FY1311_Test-Summary-Spool-Skew-and-Strain-Measurements-Using-the-Optical-Backscatter-Reflectometer.pdf
Time Domain Phase Derivative and Time Domain Wavelength Calculations
  • Optical Test
Short Summary
The time domain phase derivative and time domain wavelength calculations are detailed.  
Link
LT_TD_EN_FY1321_TimeDomainPhaseDerivative.pdf
Using a Circulator to Make Insertion Loss Measurements in Transmission with the Optical Backscatter Reflectometer
  • Optical Test
Short Summary
For situations in which the Device Under Test (DUT) exhibits a total IL that exceeds the IL dynamic range of the OBR, it is commonly still possible to measure the accumulated IL by using a circulator.
Link
LT_TD_EN-FY1306_IL-in-Transmission-Using-the-OBR-with-Circulator_v5.pdf
Using the OBR with Multi-Mode Fiber
  • Optical Test
Short Summary
Discusses methods for using the OBR with MMF
Link
LT_TD_EN-FY1301_Using_OBR_With_MMF_Rev-2.pdf

Published Papers

Title
Product Area
Automatic Maximum–Minimum Search Method for Accurate PDL and DOP Characterization
  • Polarization
  • Optical Test
Link
Automatic-Maximum%E2%80%93Minimum-Search-Method-for-Accurate-PDL-and-DOP-Characterization.pdf
Complete Characterization of Polarization-Maintaining Fibers Using Distributed Polarization Analysis
  • Polarization
  • Optical Test
Link
Complete-characterization-of-polarization-maintaining-fibers-using-distributed-polarization-analysis.pdf
High Accuracy Polarization Measurements using Binary Polarization Rotators
  • Polarization
  • Optical Test
Link
High-accuracy-polarization-measurements-using-binary-polarization-rotators.pdf
High resolution optical frequency domain reflectometry for characterization of components and assemblies
  • Optical Test
Short Summary
In this report we describe a method for polarization diverse OFDR that achieves, to the best of our knowledge, the highest reported combination of length and resolution.
Abstract

We describe a technique for polarization sensitive optical frequency domain reflectometry (OFDR) that achieves 22 micrometer two-point spatial resolution over 35 meters of optical length with -97 dB sensitivity in a single measurement taking only seconds. We demonstrate OFDR’s versatility in both time- and frequency-domain metrology by analyzing a fiber Bragg grating (FBG) in both the spectral and impulse response domains. We also demonstrate how a polarization diversity receiver can be used in an OFDR system to track changes in the polarization state of light propagating through a birefringent component.

Citation
B. Soller, D. Gifford, M. Wolfe, and M. Froggatt, "High resolution optical frequency domain reflectometry for characterization of components and assemblies," Opt. Express 13, 666-674 (2005).
Link
http://www.opticsinfobase.org/oe/fulltext.cfm?uri=oe-13-2-666&id=82408
Polarization Resolved Measurement of Rayleigh Backscatter in Fiber-Optic Components
  • Optical Test
Short Summary
Measuring the distribution of the light scattered in the backward direction as a function of length down a fiber-optic assembly can be useful in identifying breaks, bad spices and non-reflective events. This method has significant advantages in range, resolution, speed and usability when compared to conventional reflectometers.
Abstract

In this paper, we introduce a method for fiber-optic testing and troubleshooting at the assembly level that is based on using OFDR to measure the distributed Rayleigh backscatter along the length of the fiber-optic network. Measuring the distribution of the light scattered in the backward direction as a function of length down a fiber-optic assembly can be useful in identifying breaks, bad spices and non-reflective events. Rayleigh scatter can also be used to measure distributed loss and gain, induced stress and strain, temperature, and local birefringence.

Citation
B. Soller, M. Wolfe, and M. Froggatt, "Polarization Resolved Measurement of Rayleigh Backscatter in Fiber-Optic Components," in Optical Fiber Communication Conference and Exposition and The National Fiber Optic Engineers Conference, Technical Digest (CD) (Optical Society of America, 2005), paper NWD3.
Link
OBR-Technical-Paper.pdf
Return Loss Measurement in the Presence of Variable Insertion Loss Using Optical Frequency Domain Reflectometry
  • Optical Test
Short Summary
The capability of measuring localized insertion loss using OFDR presents a unique opportunity to provide consistent
measurements of device RL even in the presence of variable connector loss, even for short lead lengths. This paper outlines the methodology used to establish a value for the scatter in optical fiber, and how this Rayleigh scatter level is used to maintain consistent reflection measurements.
Abstract

The high spatial resolution and high sensitivity inherent to optical frequency domain reflectometery enables precise measurements of distributed insertion loss and return loss events. The ability to compensate return loss for variable insertion loss greatly adds to the accuracy and practicality of measurements. Further, the capability of measuring the Rayleigh backscatter internal to the instrument provides a stable power calibration artifact.

Citation
S. Kreger et al., “Return Loss Measurement in the Presence of Variable Insertion Loss Using Optical Frequency Domain Reflectometry,” NIST SPECIAL PUBLICATION SP, 2006, 1055, 18.
Link
Return-Loss-Measurement-with-OFDR1.pdf