Laser Spectrum Tester
The LST 4100 is an optical laser parameter tester targeting on-wafer applications where speed and accuracy are at a premium. Laser power, wavelength and SMSR can be repeatably measured at 100 Hz while laser current and temperature are varied.
Product Description
The LST 4100 leverages Luna’s patented fiber Fabry-Perot filter and wavelength reference technology, paired with on-board high-performance DSP and real-time FPGA processing from our established HYPERION sensing platform, to execute our unique digital signal processing technology. The synergy of all these LST 4100 technologies facilitates full-laser spectrum data, laser peak and side modes detection, and reporting of these parameters every 10 msec!
The LST 4100 is the industry’s fastest laser tester, designed to open the optical wafer testing bottleneck, enabling high-speed/high-volume laser qualification testing. A single LST 4100 outpaces multiple slower traditional optical spectrum analyzers, reducing capex, space and complexity to increase PIC fab throughput. The LST 4100 operates from 1260 to 1360 nm addressing many emerging Si Photonic laser applications including LiDAR and WDM datacenter laser transmitters.