Luna Innovations, ECSite, and DiCon Showcase Automated Multi-Channel Photonics Testing at OFC 2026
Integrated solution delivers up to 80% faster throughput and 99% fewer production errors by combining Luna OFDR technology, DiCon MEMS optical switching, and ECSite’s LuminECsa™ automation platform.
LOS ANGELES – March 13, 2026 – Luna Innovations, a leader in advanced photonics, in partnership with ECSite, will showcase a Rapid Multi-Channel Fiber & Photonics Testing solution at OFC 2026. Developed with DiCon Fiberoptics, this turnkey platform improves production-scale testing for silicon photonics, quantum systems, and AI infrastructure.
The integrated system combines Luna Innovations’ LWA 7600 Series Optical Frequency Domain Reflectometer (OFDR), DiCon Fiberoptics’ MEMS optical switching, and ECSite’s LuminECsa™ automation platform. By integrating Luna’s precision measurement with industrial-grade automation, manufacturers can characterize multiple channels within a single instrument cycle.
As AI infrastructure drives growth in high-capacity optical interconnects, testing workflows have become increasingly complex. Characterizing insertion loss (IL), return loss (RL), and latency across multiple channels often requires manual reconnections and fragmented This solution addresses these challenges with an integrated architecture that combines precision instrumentation, switching, and automation software into a single environment capable of characterizing multiple channels from one instrument cycle
“Photonics and fiber manufacturers are scaling rapidly, but fragmented testing often remains a bottleneck,” said Subbu Meiyappan, CEO & Founder of ECSite. “By integrating Luna’s OFDR measurement technology and DiCon’s MEMS switching with our LuminECsa™ platform, we deliver a complete turnkey solution—hardware, switching, and software—enabling customers to automate multi-channel validation and dramatically accelerate production testing.”
Key Solution Advantages
- Automated 1xN or MxN Optical Switching – DiCon MEMS technology routes channels sequentially, eliminating manual reconnections during production cycles.
- High-Speed OFDR with Zero Dead Zones – Luna’s OFDR technology enables sub-2 second scans with sub-micrometer resolution, eliminating "blind spots" in dense PICs.
- Comprehensive Single-Scan Characterization – The LWA 7601-C measures IL, RL, fiber length, and spectral response simultaneously, providing complete characterization data in one cycle.
- Production-Ready Automation – LuminECsa™ orchestrates automated workflows and provides centralized dashboards for real-time pass/fail analysis and cloud-based reporting.
- Scalable Architecture – The modular platform allows for seamless expansion of switching and instrumentation as testing capacity grows.
At the core of this integrated solution is LuminECsa™, which orchestrates automated testing workflows for the Luna LWA 7601-C. By providing centralized dashboards for critical measurements including IL, RL, fiber length, and latency, the platform ensures that high-resolution data is immediately actionable
Attendees at OFC 2026 (March 17–19) can see the integrated solution demonstrated at the Luna Innovations booth (#1909) at the Los Angeles Convention Center; or to pre-arrange a meeting with our experienced team contact us.