Automated PIC Probe Station

Simplify and accelerate die characterization; get answers and insights within minutes.

Streamline the testing and characterization of photonic integrated circuits (PICs) with the automated probe station. Incorporating state-of-art optical probing and alignment technology from Maple Leaf Photonics and the advanced photonic measurement capabilities of the Luna Innovations platform, this system automates and simplifies the testing of optical devices.

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