Luna T-Ray® 5600 Terahertz Control Unit
T-Ray® 5600/5700

Terahertz Control Unit

The T-Ray® 5600 is the latest model in the Luna T-Ray® 5000 platform, offering enhanced reliability, maintainability, and performance through a complete redesign of its optical subsystems and advanced electronics. It provides precise terahertz waveform control, generation, and detection for fast, accurate measurements, with processing speeds up to 1,000 times per second, making it the fastest industrial terahertz system. The T-Ray® 5700 offers the same measurement capabilities, with added cybersecurity features. 

Equipped with intelligent sensors and updated control units for seamless integration with industrial automation and robotics, both models are ideal for applications such as thickness measurements, extruded shape analysis, density and basis weight measurements, and ultra-high-speed measurements of moving samples.

Product Description

The TCU56xx is the latest edition to the T-Ray® 5000 product line. The instrument comes standard with two channels and is available in multiple delay configurations to accommodate a broad set of measurement ranges. The TCU56xx is ideal for:

  • High precision thickness measurements of single-layer and multi-layer materials and coatings
  • Multi-point measurements of extruded shapes (ie OD, ID, concentricity, ovality, etc.)
  • Density and basis weight measurements for a variety of materials
  • Ultra high speed measurements of moving samples for online process monitoring and control

The TCU56xx is compatible with a variety of gauges and sensors that are connected via robust cabling and connection interfaces. Additionally, the powerful and user friendly T-Ray® Server Software enables the user to quickly and easily transform Terahertz signals into meaningful measurements. The system can be easily integrated with industrial automation and robotics through an abundance of communications protocols and I/O options.

  • Key Features
    • Ultra high speed measurements of moving samples for online process monitoring
    • High precision thickness measurements of single and multi-layer material structures
    • Dual optical channels for multiple simultaneous measurements in either reflection or transmission
    • Powerful and user-friendly application oriented software platform
    • Fiber coupled sensor allows product scanning via high flex umbilical cable
  • Benefits
    • Cost savings through improved process yields
    • Simple user interface with independent measurement recipes
    • Abundance of communication protocols and I/O options
    • Provides measurement data in engineering units
    • Easy integration with industrial automation and robotics
  • Applications
    • Thickness measurement during coating application process
    • Multi-point measurements of extruded tubing and shapes (ie OD, ID, concentricity, ovality, etc.)
    • Top and bottom balance of steel and textile cord tire ply
    • Density and basis weight measurements for multiple materials
    • Quality inspection and non-destructive testing of coating thickness
    • Listed solution for Class I Division 1 hazardous locations
  • Technical Specifications
    Measurement PerformanceTCU5610TCU5611TCU5612TCU5613
    Bandwidth 1.5 GHz to 5 THz (depends on sensor type and measurement time)
    Dynamic Range90 dB (varies by sensor type)
    Delay320 ps80 ps160 ps700 ps
    Measurement Range50 mm12 mm25 mm100 mm
     Measurement Precision < 1 µm
    Measurement Rate Up to 100 HzUp to 1,000 HzUp to 100 HzUp to 1,000 Hz

    For full specifications, please download the data sheet.

     

  • Documentation

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