More Than Just a Reflectometer
Tracks changes in polarization state, measures group delay.
Component Characterization with Unprecedented Visibility
See inside the component and evaluate each interface for RL, IL dispersion, and more.
Accelerate Design Iterations
A full range of measurements in a single scan. Up to 30 meters with 10 micron resolution in just 7 seconds.
Making Silicon Work at the Speed of Light
Methods to Minimize Power Dissipation
Limiting total power dissipation is critical to minimize heating and signal degradation.
Identify the Location of Power Loss Inside the Chip
Characterize power loss across interfaces inside the chip with micron resolution.
Polarization Mode Dispersion
Quantify the impact to polarization caused by imperfections in physical dimensions and characteristics of the light paths.
A Spiral Delay Line Fabricated on a Silicon Platform – An Analysis Using Luna’s OBR 4600
Total Distributed Loss Across 1 meter Silicon Photonics Spiral Delay Line
Return Loss of Fiber and Face Reflection
Dispersion Measurement through Device
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